1.
Rosli N, Chan K, A. Rahman S, Putri Jamal I, Aspanut Z. Structural and Optical Properties of SiOx/Au/SiOx Layer Films on the Effect of Rapid Thermal Annealing Process: Chemical Vapour Deposition. Int. J. Fundam. Phys. Sci [Internet]. 2011Dec.31 [cited 2024Oct.8];1(4):74-7. Available from: https://fundamentaljournals.org/index.php/ijfps/article/view/95